struct nvme_self_test_log - Device Self-test (Log Identifier
06h)
struct nvme_self_test_log {
__u8 current_operation;
__u8 completion;
__u8 rsvd[2];
struct nvme_st_result result[NVME_LOG_ST_MAX_RESULTS];
};
- current_operation
- Current Device Self-Test Operation: indicates the status of the current
device self-test operation. If a device self-test operation is in process
(i.e., this field is set to #NVME_ST_CURR_OP_SHORT or
#NVME_ST_CURR_OP_EXTENDED), then the controller shall not set this field
to #NVME_ST_CURR_OP_NOT_RUNNING until a new Self-test Result Data
Structure is created (i.e., if a device self-test operation completes or
is aborted, then the controller shall create a Self-test Result Data
Structure prior to setting this field to #NVME_ST_CURR_OP_NOT_RUNNING).
See enum nvme_st_curr_op.
- completion
- Current Device Self-Test Completion: indicates the percentage of the
device self-test operation that is complete (e.g., a value of 25 indicates
that 25% of the device self-test operation is complete and 75% remains to
be tested). If the current_operation field is cleared to
#NVME_ST_CURR_OP_NOT_RUNNING (indicating there is no device self-test
operation in progress), then this field is ignored.
- rsvd
- Reserved
- result
- Self-test Result Data Structures, see struct nvme_st_result.