struct nvme_st_result - Self-test Result
struct nvme_st_result {
__u8 dsts;
__u8 seg;
__u8 vdi;
__u8 rsvd;
__le64 poh;
__le32 nsid;
__le64 flba;
__u8 sct;
__u8 sc;
__u8 vs[2];
};
- dsts
- Device Self-test Status: Indicates the device self-test code and the
status of the operation (see enum nvme_status_result and enum
nvme_st_code).
- seg
- Segment Number: Iindicates the segment number where the first self-test
failure occurred. If Device Self-test Status (dsts) is not set to
#NVME_ST_RESULT_KNOWN_SEG_FAIL, then this field should be ignored.
- vdi
- Valid Diagnostic Information: Indicates the diagnostic failure information
that is reported. See enum nvme_st_valid_diag_info.
- rsvd
- Reserved
- poh
- Power On Hours (POH): Indicates the number of power-on hours at the time
the device self-test operation was completed or aborted. This does not
include time that the controller was powered and in a low power state
condition.
- nsid
- Namespace Identifier (NSID): Indicates the namespace that the Failing LBA
occurred on. Valid only when the NSID Valid bit
(#NVME_ST_VALID_DIAG_INFO_NSID) is set in the Valid Diagnostic Information
(vdi) field.
- flba
- Failing LBA: indicates the LBA of the logical block that caused the test
to fail. If the device encountered more than one failed logical block
during the test, then this field only indicates one of those failed
logical blocks. Valid only when the NSID Valid bit
(#NVME_ST_VALID_DIAG_INFO_FLBA) is set in the Valid Diagnostic Information
(vdi) field.
- sct
- Status Code Type: This field may contain additional information related to
errors or conditions. Bits 2:0 may contain additional information relating
to errors or conditions that occurred during the device self-test
operation represented in the same format used in the Status Code Type
field of the completion queue entry (refer to enum
nvme_status_field). Valid only when the NSID Valid bit
(#NVME_ST_VALID_DIAG_INFO_SCT) is set in the Valid Diagnostic Information
(vdi) field.
- sc
- Status Code: This field may contain additional information relating to
errors or conditions that occurred during the device self-test operation
represented in the same format used in the Status Code field of the
completion queue entry. Valid only when the SCT Valid bit
(#NVME_ST_VALID_DIAG_INFO_SC) is set in the Valid Diagnostic Information
(vdi) field.
- vs
- Vendor Specific.